In this work, we propose a method to easily determine the aberrations of a Holoeye LC-R720 and to efficiently compensate them, taking into account the changes of the aberrations because of modifications of the strains onto the support structure, for instance due to mounting. In this work, we propose a method to easily determine the aberrations of a Holoeye LC-R720 and to efficiently compensate them, taking into account the changes of the aberrations because of modifications of the strains onto the support structure, for instance due to mounting. The spatial light modulator (SLM) Holoeye LC-R720 is based on LCoS (Liquid Crystal on Silicon) technology. Due to the induced curvatures on the silicon plate by the production process, there are static aberrations in the wave-fronts modified by the SLM. In order to calculate the aberrated. We sought to do this by replacing the traditional expensive aberration-corrected, high-numerical-aperture lenses with cheap PDMS (silicon rubber) droplet lenses that we made in the lab. The droplet lenses are extremely cheap but prone to optical aberrations which we compensate for, externally, by. Achieving atomic resolution in electron microscopy has historically been hindered by spherical aberration, a fundamental limitation of conventional electron lenses. Its correction typically requires complex assemblies of electromagnetic multipoles. Here, we demonstrate that third-order spherical.